Gooodlab RMS-1000S series high temperature semiconductor material resistivity measurement system
CATEGORY AND TAGS:
Resistance & Resistivity Measurement
RMS-1000S series semiconductor resistivity measurement system is mainly used for the evaluation and testing of the electrical conductivity of semiconductor materials, the system adopts the four-wire resistance measurement principle for design and development, and can measure the resistance and resistivity of semiconductor materials under high temperature and vacuum atmosphere conditions, and can analyze the curve of the resistance and resistivity of the sample under test with temperature and time. It can be widely used for the resistivity measurement of silicon (si), germanium (ge), gallium arsenide (GaAs), indium antimonide (InSb), GaAsAl, GaAsP, solid solution semiconductors such as Ge-Si, GaAs-GaP, and other bulk materials. Resistivity measurement of materials such as GeSi, GaAs-GaP, etc.
Temperature range: RT-600℃/1000℃
Test channel: single channel
Power supply: 220V±10%, 50Hz
Temperature rise slope: 0-10℃/min (typical value: 3℃/min)
Sample size: φ＜20mm, d＜5mm
operating temperature: 5 ℃ to + 40 ℃;
Temperature control accuracy: ± 0.5 ℃
Electrode material: upper and lower platinum electrodes
Storage temperature: -40 ℃ to +65 ℃
Resistance measurement range: 0.1mΩ~100MΩ
Temperature control mode: PID precise temperature control
Operating humidity: +40 ℃, relative humidity up to 95% (non-condensing)
Resistivity measurement range: 1mΩ.cm~10MΩ.cm
Data storage format: TXT text format
Equipment size: 630x640x450mm (L×H×W)
Measurement environment: air, flowing atmosphere, vacuum atmosphere
Data transmission: USB
Weight: 38kg
Measurement method: semiconductor material 2-wire method
Conformity to standards: ASTM
Warranty: 1 year
enquiry
